Pure copper grades
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| Company standard EN |
CU1 CW009A |
CU2 CW008A |
CU3 CW008A |
CU50 CW004A |
|---|---|---|---|---|
| Copper content | > 99,99 % |
Cu+Ag > 99,98 % | Cu+Ag > 99,96 % | Cu+Ag > 99,90 % |
| Exygen content | < 8 ppm |
< 10 ppm | no oxides when enlarged 200fold |
max. 0,04 % |
| Electrical conductivity | > 101 % IACS * > 58,6 m/Ω·mm²** |
> 100 % IACS * > 58,0 m/Ω·mm²** |
> 100 % IACS * > 58,0 m/Ω·mm²** |
> 100 % IACS * >58,0 m/Ω· mm²** |
| other characteristics | P < 3 ppm Formation of tight compounds with glass. Resistant to hydrogen embrittlement. No release of volatile matter into the vacuum. |
High electrical conductivity. Resistant to hydrogen embrittlement. |
High electrical conductivity. Resistant to hydrogen embrittlement. |
High electrical conductivity. |
| Field of uses | High-vacuum engineering; high-performance transmission cables; microelectronics; travelling-wave magnetrons and electronic tubes |
Vacuum engineering; electronics; anodes; electrical instruments in the presence of reducing gases; switch- gears and switching devices | Electronics; switchgear device construction; general use in electrical engineering |
Switchgear device construction; general use in electrical engineering, if no requirements on the resistance to hydrogen embrittlement |
* Conversion IACS to m/Ω · mm²
100 % IACS corresponds to a conductivity of 58.0 m/Ω · mm²
** The specification of electrical conductivity relates to the annealed condition